From owner-freebsd-hackers Sat Nov 1 13:53:15 1997 Return-Path: Received: (from root@localhost) by hub.freebsd.org (8.8.7/8.8.7) id NAA10059 for hackers-outgoing; Sat, 1 Nov 1997 13:53:15 -0800 (PST) (envelope-from owner-freebsd-hackers) Received: from trojanhorse.ml.org (mdean.vip.best.com [206.86.94.101]) by hub.freebsd.org (8.8.7/8.8.7) with ESMTP id NAA10054 for ; Sat, 1 Nov 1997 13:53:12 -0800 (PST) (envelope-from jamil@trojanhorse.ml.org) Received: from localhost (jamil@localhost) by trojanhorse.ml.org (8.8.7/8.8.5) with SMTP id NAA00468 for ; Sat, 1 Nov 1997 13:53:05 -0800 (PST) Date: Sat, 1 Nov 1997 13:53:05 -0800 (PST) From: "Jamil J. Weatherbee" To: hackers@freebsd.org Subject: 7400 gates effected by probe routine Message-ID: MIME-Version: 1.0 Content-Type: TEXT/PLAIN; charset=US-ASCII Sender: owner-freebsd-hackers@freebsd.org X-Loop: FreeBSD.org Precedence: bulk During a device probing routine I noticed that it is possible for the outputs of two 7400 TTL gates one in the high state and one in the low state to be connected together for not more than 10 microseconds. I was looking at a transistor level diagram of a 7400 and would like to verify the following. That this should not damage the gate itself, just pull about 10 times the normal current. I don't see anyway to get around this without just removing the probe routine.