Date: Sat, 1 Nov 1997 13:53:05 -0800 (PST) From: "Jamil J. Weatherbee" <jamil@trojanhorse.ml.org> To: hackers@freebsd.org Subject: 7400 gates effected by probe routine Message-ID: <Pine.BSF.3.96.971101134241.459A-100000@trojanhorse.ml.org>
next in thread | raw e-mail | index | archive | help
During a device probing routine I noticed that it is possible for the outputs of two 7400 TTL gates one in the high state and one in the low state to be connected together for not more than 10 microseconds. I was looking at a transistor level diagram of a 7400 and would like to verify the following. That this should not damage the gate itself, just pull about 10 times the normal current. I don't see anyway to get around this without just removing the probe routine.
Want to link to this message? Use this URL: <https://mail-archive.FreeBSD.org/cgi/mid.cgi?Pine.BSF.3.96.971101134241.459A-100000>